Alano JH, Rodrigues L da S, Maron GK, Noremberg B da S, de Oliveira AD, Paniz O, do Nascimento RM, Carreño NLV. A Simple and Complete Supercapacitor Characterization System Using a Programmable Sourcemeter. Orbital: Electron. J. Chem. [Internet]. 2019Apr.30 [cited 2024Dec.21];11(2):133-41. Available from: https://periodicos.ufms.br/index.php/orbital/article/view/16001